Tuesday, May 5, 2020
TCS launches AI-powered solution to detect wafer anomaly in semiconductor manufacturing
The solution harnesses the company's contextual knowledge of the semiconductor industry and the power of deep learning tech, to help chip makers digitally re-imagine their product quality assurance process. Sophisticated quality inspection of wafers during the semiconductor manufacturing process is essential to detect and classify defects early and accurately, TCS said. https://ift.tt/2zaL65k
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